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Experimental investigation of self heating effect (SHE) in ..:
Jiang, Hai
;
Xu, Nuo
;
Chen, Bing
...
Semiconductor Science and Technology. 29 (2014) 11 - p. 115021 , 2014
Link:
https://doi.org/10.1088/0268-1242/29/11/115021
RT Journal T1 <Title>Experimental investigation of self heating effect (SHE) in multiple-fin SOI FinFETs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0268-1242_29_11_115021&Exemplar=1&LAN=DE A1 Jiang, Hai A1 Xu, Nuo A1 Chen, Bing A1 Zeng, Lang A1 He, Yandong A1 Du, Gang A1 Liu, Xiaoyan A1 Zhang, Xing PB IOP Publishing YR 2014 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 29 IS 11 SP 115021 LK http://dx.doi.org/https://doi.org/10.1088/0268-1242/29/11/115021 DO https://doi.org/10.1088/0268-1242/29/11/115021 SF ELIB - SuUB Bremen
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