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Assessment of DC and low-frequency noise performances of tr..:
Cretu, B
;
Boudier, D
;
Simoen, E
..
Semiconductor Science and Technology. 31 (2016) 12 - p. 124006 , 2016
Link:
https://doi.org/10.1088/0268-1242/31/12/124006
RT Journal T1 <Title>Assessment of DC and low-frequency noise performances of triple-gate FinFETs at cryogenic temperatures</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0268-1242_31_12_124006&Exemplar=1&LAN=DE A1 Cretu, B A1 Boudier, D A1 Simoen, E A1 Veloso, A A1 Collaert, N PB IOP Publishing YR 2016 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 31 IS 12 SP 124006 LK http://dx.doi.org/https://doi.org/10.1088/0268-1242/31/12/124006 DO https://doi.org/10.1088/0268-1242/31/12/124006 SF ELIB - SuUB Bremen
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