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Laser-scanning tomography: a survey of recent investigation..:
Fillard, J P
;
Gall, P
;
Bonnafe, J
..
Semiconductor Science and Technology. 7 (1992) 1A - p. A283-A287 , 1992
Link:
https://doi.org/10.1088/0268-1242/7/1a/054
RT Journal T1 <Title>Laser-scanning tomography: a survey of recent investigations in semiconductor materials</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0268-1242_7_1a_054&Exemplar=1&LAN=DE A1 Fillard, J P A1 Gall, P A1 Bonnafe, J A1 Castagne, M A1 Ogawa, T PB IOP Publishing YR 1992 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 7 IS 1A SP A283 OP A287 LK http://dx.doi.org/https://doi.org/10.1088/0268-1242/7/1a/054 DO https://doi.org/10.1088/0268-1242/7/1a/054 SF ELIB - SuUB Bremen
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