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1 Ergebnisse
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Influence of stabilizer thickness on over-current test of Y..:
Kwon, N Y
;
Kim, H S
;
Kim, K L
...
Superconductor Science and Technology. 22 (2009) 4 - p. 045003 , 2009
Link:
https://doi.org/10.1088/0953-2048/22/4/045003
RT Journal T1 <Title>Influence of stabilizer thickness on over-current test of YBCO-coated conductors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0953-2048_22_4_045003&Exemplar=1&LAN=DE A1 Kwon, N Y A1 Kim, H S A1 Kim, K L A1 Yim, S W A1 Kim, H-R A1 Hyun, O-B A1 Kim, H M A1 Lee, H G PB IOP Publishing YR 2009 SN 0953-2048 SN 1361-6668 JF Superconductor Science and Technology VO 22 IS 4 SP 045003 LK http://dx.doi.org/https://doi.org/10.1088/0953-2048/22/4/045003 DO https://doi.org/10.1088/0953-2048/22/4/045003 SF ELIB - SuUB Bremen
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