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Temperature-and field dependent characterization of a twist..:
Barth, C
;
Takayasu, M
;
Bagrets, N
...
Superconductor Science and Technology. 28 (2015) 4 - p. 045015 , 2015
Link:
https://doi.org/10.1088/0953-2048/28/4/045015
RT Journal T1 <Title>Temperature-and field dependent characterization of a twisted stacked-tape cable</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0953-2048_28_4_045015&Exemplar=1&LAN=DE A1 Barth, C A1 Takayasu, M A1 Bagrets, N A1 Bayer, C M A1 Weiss, K-P A1 Lange, C PB IOP Publishing YR 2015 SN 0953-2048 SN 1361-6668 JF Superconductor Science and Technology VO 28 IS 4 SP 045015 LK http://dx.doi.org/https://doi.org/10.1088/0953-2048/28/4/045015 DO https://doi.org/10.1088/0953-2048/28/4/045015 SF ELIB - SuUB Bremen
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