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1 Ergebnisse
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The effect of interface roughness on the transport properti..:
Zianni, X
;
Butcher, P N
Journal of Physics: Condensed Matter. 6 (1994) 14 - p. 2713-2726 , 1994
Link:
https://doi.org/10.1088/0953-8984/6/14/009
RT Journal T1 <Title>The effect of interface roughness on the transport properties of a two-dimensional electron gas in a Si-MOSFET</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0953-8984_6_14_009&Exemplar=1&LAN=DE A1 Zianni, X A1 Butcher, P N PB IOP Publishing YR 1994 SN 0953-8984 SN 1361-648X JF Journal of Physics: Condensed Matter VO 6 IS 14 SP 2713 OP 2726 LK http://dx.doi.org/https://doi.org/10.1088/0953-8984/6/14/009 DO https://doi.org/10.1088/0953-8984/6/14/009 SF ELIB - SuUB Bremen
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