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Characterization of titanium nitride layers by positron ann..:
Uhlmann, K
;
Harting, M
;
Britton, D T
Journal of Physics: Condensed Matter. 6 (1994) 15 - p. 2943-2948 , 1994
Link:
https://doi.org/10.1088/0953-8984/6/15/016
RT Journal T1 <Title>Characterization of titanium nitride layers by positron annihilation and X-ray diffraction</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_0953-8984_6_15_016&Exemplar=1&LAN=DE A1 Uhlmann, K A1 Harting, M A1 Britton, D T PB IOP Publishing YR 1994 SN 0953-8984 SN 1361-648X JF Journal of Physics: Condensed Matter VO 6 IS 15 SP 2943 OP 2948 LK http://dx.doi.org/https://doi.org/10.1088/0953-8984/6/15/016 DO https://doi.org/10.1088/0953-8984/6/15/016 SF ELIB - SuUB Bremen
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