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1 Ergebnisse
1
Study of total ionizing dose radiation effects on enclosed ..:
Dong-Mei, Li
;
Zhi-Hua, Wang
;
Li-Ying, Huangfu
.
Chinese Physics. 16 (2007) 12 - p. 3760-3765 , 2007
Link:
https://doi.org/10.1088/1009-1963/16/12/034
RT Journal T1
Study of total ionizing dose radiation effects on enclosed gate transistors in a commercial CMOS technology
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1009-1963_16_12_034&Exemplar=1&LAN=DE A1 Dong-Mei, Li A1 Zhi-Hua, Wang A1 Li-Ying, Huangfu A1 Qiu-Jing, Gou PB IOP Publishing YR 2007 SN 1009-1963 SN 1741-4199 JF Chinese Physics VO 16 IS 12 SP 3760 OP 3765 LK http://dx.doi.org/https://doi.org/10.1088/1009-1963/16/12/034 DO https://doi.org/10.1088/1009-1963/16/12/034 SF ELIB - SuUB Bremen
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