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Unveiling a critical thickness in photocatalytic TiO2 thin ..:
Ravisy, W
;
Richard-Plouet, M
;
Dey, B
...
Journal of Physics D: Applied Physics. 54 (2021) 44 - p. 445303 , 2021
Link:
https://doi.org/10.1088/1361-6463/ac1ec1
RT Journal T1 <Title>Unveiling a critical thickness in photocatalytic TiO2 thin films grown by plasma-enhanced chemical vapor deposition using real time in situ spectroscopic ellipsometry</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6463_ac1ec1&Exemplar=1&LAN=DE A1 Ravisy, W A1 Richard-Plouet, M A1 Dey, B A1 Bulou, S A1 Choquet, P A1 Granier, A A1 Goullet, A PB IOP Publishing YR 2021 SN 0022-3727 SN 1361-6463 JF Journal of Physics D: Applied Physics VO 54 IS 44 SP 445303 LK http://dx.doi.org/https://doi.org/10.1088/1361-6463/ac1ec1 DO https://doi.org/10.1088/1361-6463/ac1ec1 SF ELIB - SuUB Bremen
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