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The heat dissipation path of self-heating effects for the S..:
Li, Y F
;
Xu, L D
;
Ni, T
...
Journal of Physics D: Applied Physics. 57 (2024) 17 - p. 175101 , 2024
Link:
https://doi.org/10.1088/1361-6463/ad2006
RT Journal T1 <Title>The heat dissipation path of self-heating effects for the SOI MOSFET by considering the BOX layer and the TiN barrier layer</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6463_ad2006&Exemplar=1&LAN=DE A1 Li, Y F A1 Xu, L D A1 Ni, T A1 Wang, J J A1 Gao, L C A1 Li, D L A1 Wang, J J A1 Ma, Q G A1 Wang, Z J A1 Zeng, C B A1 Li, B A1 Luo, J J PB IOP Publishing YR 2024 SN 0022-3727 SN 1361-6463 JF Journal of Physics D: Applied Physics VO 57 IS 17 SP 175101 LK http://dx.doi.org/https://doi.org/10.1088/1361-6463/ad2006 DO https://doi.org/10.1088/1361-6463/ad2006 SF ELIB - SuUB Bremen
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