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1 Ergebnisse
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Fast artifact filtering algorithm for electrical resistivit..:
Han, Siyuan
;
Yu, Guoqiang
;
Lu, Wei
...
Measurement Science and Technology. 34 (2023) 6 - p. 065601 , 2023
Link:
https://doi.org/10.1088/1361-6501/acbc3c
RT Journal T1 <Title>Fast artifact filtering algorithm for electrical resistivity tomography</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6501_acbc3c&Exemplar=1&LAN=DE A1 Han, Siyuan A1 Yu, Guoqiang A1 Lu, Wei A1 Xue, Beichen A1 Gao, Xiguang A1 Song, Yingdong PB IOP Publishing YR 2023 SN 0957-0233 SN 1361-6501 JF Measurement Science and Technology VO 34 IS 6 SP 065601 LK http://dx.doi.org/https://doi.org/10.1088/1361-6501/acbc3c DO https://doi.org/10.1088/1361-6501/acbc3c SF ELIB - SuUB Bremen
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