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A 50 pico-g resolution integrated test facility for high-pr..:
Mei, Bin
;
Ma, Cheng
;
Bai, Yanzheng
...
Measurement Science and Technology. 34 (2023) 11 - p. 115016 , 2023
Link:
https://doi.org/10.1088/1361-6501/acec07
RT Journal T1 <Title>A 50 pico-g resolution integrated test facility for high-precision inertial sensors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6501_acec07&Exemplar=1&LAN=DE A1 Mei, Bin A1 Ma, Cheng A1 Bai, Yanzheng A1 Hu, Ming A1 Liu, Li A1 Lv, Menghao A1 Ma, Yun A1 Qu, Shaobo A1 Wu, Shuchao A1 Yu, Jianbo A1 Zhou, Zebing PB IOP Publishing YR 2023 SN 0957-0233 SN 1361-6501 JF Measurement Science and Technology VO 34 IS 11 SP 115016 LK http://dx.doi.org/https://doi.org/10.1088/1361-6501/acec07 DO https://doi.org/10.1088/1361-6501/acec07 SF ELIB - SuUB Bremen
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