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Research on the examination technology of connector pin ske..:
Pan, Ruizhi
;
Li, Chao
;
Hu, Bo
.
Measurement Science and Technology. 35 (2023) 3 - p. 035004 , 2023
Link:
https://doi.org/10.1088/1361-6501/ad10df
RT Journal T1 <Title>Research on the examination technology of connector pin skewing according to Blob analysis*</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6501_ad10df&Exemplar=1&LAN=DE A1 Pan, Ruizhi A1 Li, Chao A1 Hu, Bo A1 Liu, Yumei PB IOP Publishing YR 2023 SN 0957-0233 SN 1361-6501 JF Measurement Science and Technology VO 35 IS 3 SP 035004 LK http://dx.doi.org/https://doi.org/10.1088/1361-6501/ad10df DO https://doi.org/10.1088/1361-6501/ad10df SF ELIB - SuUB Bremen
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