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Detection and metrology of micro-nano particles through the..:
Tao, Yikun
;
He, Hu
Measurement Science and Technology. 35 (2024) 7 - p. 075003 , 2024
Link:
https://doi.org/10.1088/1361-6501/ad3a8c
RT Journal T1 <Title>Detection and metrology of micro-nano particles through the integration of image and laser modes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6501_ad3a8c&Exemplar=1&LAN=DE A1 Tao, Yikun A1 He, Hu PB IOP Publishing YR 2024 SN 0957-0233 SN 1361-6501 JF Measurement Science and Technology VO 35 IS 7 SP 075003 LK http://dx.doi.org/https://doi.org/10.1088/1361-6501/ad3a8c DO https://doi.org/10.1088/1361-6501/ad3a8c SF ELIB - SuUB Bremen
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