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1 Ergebnisse
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Thickness measurements of graphene oxide flakes using atomi..:
Bu, Tianjia
;
Gao, Huifang
;
Yao, Yaxuan
...
Nanotechnology. 34 (2023) 22 - p. 225702 , 2023
Link:
https://doi.org/10.1088/1361-6528/acbf58
RT Journal T1
Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6528_acbf58&Exemplar=1&LAN=DE A1 Bu, Tianjia A1 Gao, Huifang A1 Yao, Yaxuan A1 Wang, Jianfeng A1 Pollard, Andrew J A1 Legge, Elizabeth J A1 Clifford, Charles A A1 Delvallée, Alexandra A1 Ducourtieux, Sébastien A1 Lawn, Malcolm A A1 Babic, Bakir A1 Coleman, Victoria A A1 Jämting, Åsa A1 Zou, Shan A1 Chen, Maohui A1 Jakubek, Zygmunt J A1 Iacob, Erica A1 Chanthawong, Narin A1 Mongkolsuttirat, KittiSun A1 Zeng, Guanghong A1 Almeida, Clara Muniz A1 He, Bo-Ching A1 Hyde, Lachlan A1 Ren, Lingling PB IOP Publishing YR 2023 SN 0957-4484 SN 1361-6528 JF Nanotechnology VO 34 IS 22 SP 225702 LK http://dx.doi.org/https://doi.org/10.1088/1361-6528/acbf58 DO https://doi.org/10.1088/1361-6528/acbf58 SF ELIB - SuUB Bremen
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