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1 Ergebnisse
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Identification of the monolayer thickness difference in a m..:
Hattori, Yoshiaki
;
Taniguchi, Takashi
;
Watanabe, Kenji
.
Nanotechnology. 34 (2023) 29 - p. 295701 , 2023
Link:
https://doi.org/10.1088/1361-6528/accf23
RT Journal T1
Identification of the monolayer thickness difference in a mechanically exfoliated thick flake of hexagonal boron nitride and graphite for van der Waals heterostructures
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6528_accf23&Exemplar=1&LAN=DE A1 Hattori, Yoshiaki A1 Taniguchi, Takashi A1 Watanabe, Kenji A1 Kitamura, Masatoshi PB IOP Publishing YR 2023 SN 0957-4484 SN 1361-6528 JF Nanotechnology VO 34 IS 29 SP 295701 LK http://dx.doi.org/https://doi.org/10.1088/1361-6528/accf23 DO https://doi.org/10.1088/1361-6528/accf23 SF ELIB - SuUB Bremen
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