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Probe chip nanofabrication enabled reverse tip sample scann..:
Kim, Hyeon-Su
;
Peric, Nemanja
;
Minj, Albert
...
Nanotechnology. 35 (2024) 26 - p. 265703 , 2024
Link:
https://doi.org/10.1088/1361-6528/ad3744
RT Journal T1
Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurements
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6528_ad3744&Exemplar=1&LAN=DE A1 Kim, Hyeon-Su A1 Peric, Nemanja A1 Minj, Albert A1 Wouters, Lennaert A1 Serron, Jill A1 Mancini, Chiara A1 Koylan, Serkan A1 Sergeant, Stefanie A1 Hantschel, Thomas PB IOP Publishing YR 2024 SN 0957-4484 SN 1361-6528 JF Nanotechnology VO 35 IS 26 SP 265703 LK http://dx.doi.org/https://doi.org/10.1088/1361-6528/ad3744 DO https://doi.org/10.1088/1361-6528/ad3744 SF ELIB - SuUB Bremen
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