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1 Ergebnisse
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Tools for modeling radioactive contaminants in chip materia..:
Wrobel, F
;
Kaouache, A
;
Saigné, F
...
Semiconductor Science and Technology. 32 (2017) 3 - p. 034001 , 2017
Link:
https://doi.org/10.1088/1361-6641/aa5479
RT Journal T1 <Title>Tools for modeling radioactive contaminants in chip materials</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_aa5479&Exemplar=1&LAN=DE A1 Wrobel, F A1 Kaouache, A A1 Saigné, F A1 Touboul, A D A1 Schrimpf, R D A1 Warot, G A1 Bruguier, O PB IOP Publishing YR 2017 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 32 IS 3 SP 034001 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/aa5479 DO https://doi.org/10.1088/1361-6641/aa5479 SF ELIB - SuUB Bremen
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