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Sub-picosecond pulsed THz FET detector characterization in ..:
Ikamas, K
;
Lisauskas, A
;
Massabeau, S
...
Semiconductor Science and Technology. 33 (2018) 12 - p. 124013 , 2018
Link:
https://doi.org/10.1088/1361-6641/aae905
RT Journal T1 <Title>Sub-picosecond pulsed THz FET detector characterization in plasmonic detection regime based on autocorrelation technique</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_aae905&Exemplar=1&LAN=DE A1 Ikamas, K A1 Lisauskas, A A1 Massabeau, S A1 Bauer, M A1 Burakevič, M A1 Vyšniauskas, J A1 Čibiraitė, D A1 Krozer, V A1 Rämer, A A1 Shevchenko, S A1 Heinrich, W A1 Tignon, J A1 Dhillon, S A1 Mangeney, J A1 Roskos, H G PB IOP Publishing YR 2018 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 33 IS 12 SP 124013 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/aae905 DO https://doi.org/10.1088/1361-6641/aae905 SF ELIB - SuUB Bremen
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