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1 Ergebnisse
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Optical, structural and electrical characterization of pure..:
Melnichuk, O
;
Melnichuk, L
;
Venger, Ye
...
Semiconductor Science and Technology. 35 (2020) 9 - p. 095034 , 2020
Link:
https://doi.org/10.1088/1361-6641/ab9397
RT Journal T1 <Title>Optical, structural and electrical characterization of pure ZnO films grown on p-type Si substrates by radiofrequency magnetron sputtering in different atmospheres</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_ab9397&Exemplar=1&LAN=DE A1 Melnichuk, O A1 Melnichuk, L A1 Venger, Ye A1 Guillaume, C A1 Chauvat, M-P A1 Portier, X A1 Markevich, I A1 Korsunska, N A1 Khomenkova, L PB IOP Publishing YR 2020 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 35 IS 9 SP 095034 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/ab9397 DO https://doi.org/10.1088/1361-6641/ab9397 SF ELIB - SuUB Bremen
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