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1 Ergebnisse
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Deep level defects and their instability in PLD-grown IGZO ..:
Wang, Buguo
;
Look, David
;
Anders, Jason
..
Semiconductor Science and Technology. 35 (2020) 12 - p. 124002 , 2020
Link:
https://doi.org/10.1088/1361-6641/abbd0c
RT Journal T1 <Title>Deep level defects and their instability in PLD-grown IGZO (In2Ga2Zn5O11) thin films studied by thermally stimulated current spectroscopy</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_abbd0c&Exemplar=1&LAN=DE A1 Wang, Buguo A1 Look, David A1 Anders, Jason A1 Leedy, Kevin A1 Schuette, Michael PB IOP Publishing YR 2020 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 35 IS 12 SP 124002 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/abbd0c DO https://doi.org/10.1088/1361-6641/abbd0c SF ELIB - SuUB Bremen
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