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1 Ergebnisse
1
Parasitic subthreshold drain current and low frequency nois..:
Takakura, K
;
Putcha, V
;
Simoen, E
...
Semiconductor Science and Technology. 36 (2020) 2 - p. 024003 , 2020
Link:
https://doi.org/10.1088/1361-6641/abce8c
RT Journal T1 <Title>Parasitic subthreshold drain current and low frequency noise in GaN/AlGaN metal-oxide-semiconductor high-electron-mobility field-effect-transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_abce8c&Exemplar=1&LAN=DE A1 Takakura, K A1 Putcha, V A1 Simoen, E A1 Alian, A R A1 Peralagu, U A1 Waldron, N A1 Parvais, B A1 Collaert, N PB IOP Publishing YR 2020 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 36 IS 2 SP 024003 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/abce8c DO https://doi.org/10.1088/1361-6641/abce8c SF ELIB - SuUB Bremen
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