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Development of a cryogenic indentation tool with in situ op..:
Broult, T
;
Kerlain, A
;
Destefanis, V
...
Semiconductor Science and Technology. 36 (2021) 3 - p. 035015 , 2021
Link:
https://doi.org/10.1088/1361-6641/abe2de
RT Journal T1 <Title>Development of a cryogenic indentation tool with in situ optical observation, application to the mechanical characterization of II–VI semiconductors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_abe2de&Exemplar=1&LAN=DE A1 Broult, T A1 Kerlain, A A1 Destefanis, V A1 Guinedor, P A1 Bourhis, E Le A1 Patriarche, G PB IOP Publishing YR 2021 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 36 IS 3 SP 035015 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/abe2de DO https://doi.org/10.1088/1361-6641/abe2de SF ELIB - SuUB Bremen
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