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1 Ergebnisse
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Coexistence of volatile and non-volatile resistive switchin..:
Rahmani, Mehr Khalid
;
Yang, Byung-Do
;
Kim, HyungWon
..
Semiconductor Science and Technology. 36 (2021) 9 - p. 095031 , 2021
Link:
https://doi.org/10.1088/1361-6641/ac18f7
RT Journal T1
Coexistence of volatile and non-volatile resistive switching in Ni/SiO2/Pt memristor device controlled from different current compliances
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_ac18f7&Exemplar=1&LAN=DE A1 Rahmani, Mehr Khalid A1 Yang, Byung-Do A1 Kim, HyungWon A1 Kim, Hyojin A1 Kang, Moon Hee PB IOP Publishing YR 2021 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 36 IS 9 SP 095031 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/ac18f7 DO https://doi.org/10.1088/1361-6641/ac18f7 SF ELIB - SuUB Bremen
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