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Indirect stress and air-cavity displacement measurement of ..:
Tingzon, Philippe Martin
;
Husay, Horace Andrew
;
Cabello, Neil Irvin
...
Semiconductor Science and Technology. 37 (2022) 3 - p. 035013 , 2022
Link:
https://doi.org/10.1088/1361-6641/ac4abc
RT Journal T1
Indirect stress and air-cavity displacement measurement of MEMS tunable VCSELs via micro-Raman and micro-photoluminescence spectroscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_ac4abc&Exemplar=1&LAN=DE A1 Tingzon, Philippe Martin A1 Husay, Horace Andrew A1 Cabello, Neil Irvin A1 Eslit, John Jairus A1 Cook, Kevin A1 Kapraun, Jonas A1 Somintac, Armando A1 De Leon, Maria Theresa A1 Rosales, Marc A1 Salvador, Arnel A1 Chang-Hasnain, Constance A1 Estacio, Elmer PB IOP Publishing YR 2022 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 37 IS 3 SP 035013 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/ac4abc DO https://doi.org/10.1088/1361-6641/ac4abc SF ELIB - SuUB Bremen
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