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1 Ergebnisse
1
Universal conductance fluctuations in a Bi1.5Sb0.5Te1.8Se1...:
Zimmermann, Erik
;
Kölzer, Jonas
;
Schleenvoigt, Michael
...
Semiconductor Science and Technology. 38 (2023) 3 - p. 035010 , 2023
Link:
https://doi.org/10.1088/1361-6641/acb45f
RT Journal T1
Universal conductance fluctuations in a Bi1.5Sb0.5Te1.8Se1.2 topological insulator nano-scaled Hall bar structure
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_acb45f&Exemplar=1&LAN=DE A1 Zimmermann, Erik A1 Kölzer, Jonas A1 Schleenvoigt, Michael A1 Rosenbach, Daniel A1 Mussler, Gregor A1 Schüffelgen, Peter A1 Heider, Tristan A1 Plucinski, Lukasz A1 Schubert, Jürgen A1 Lüth, Hans A1 Grützmacher, Detlev A1 Schäpers, Thomas PB IOP Publishing YR 2023 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 38 IS 3 SP 035010 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/acb45f DO https://doi.org/10.1088/1361-6641/acb45f SF ELIB - SuUB Bremen
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