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1 Ergebnisse
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Thickness dependence of resistive switching characteristics..:
Kim, Kyoungdu
;
Kim, Hae-In
;
Lee, Taehun
...
Semiconductor Science and Technology. 38 (2023) 4 - p. 045002 , 2023
Link:
https://doi.org/10.1088/1361-6641/acbb99
RT Journal T1 <Title>Thickness dependence of resistive switching characteristics of the sol–gel processed Y2O3 RRAM devices</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_acbb99&Exemplar=1&LAN=DE A1 Kim, Kyoungdu A1 Kim, Hae-In A1 Lee, Taehun A1 Lee, Won-Yong A1 Bae, Jin-Hyuk A1 Kang, In Man A1 Lee, Sin-Hyung A1 Kim, Kwangeun A1 Jang, Jaewon PB IOP Publishing YR 2023 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 38 IS 4 SP 045002 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/acbb99 DO https://doi.org/10.1088/1361-6641/acbb99 SF ELIB - SuUB Bremen
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