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1 Ergebnisse
1
Temperature effects on the performance of ferroelectric FET..:
Li, Qiang
;
Li, Ming-Hao
;
Hsu, Hsiao-Hsuan
...
Semiconductor Science and Technology. 38 (2023) 5 - p. 055012 , 2023
Link:
https://doi.org/10.1088/1361-6641/acc547
RT Journal T1
Temperature effects on the performance of ferroelectric FET with random grain phase variation for non-volatile memory application
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_acc547&Exemplar=1&LAN=DE A1 Li, Qiang A1 Li, Ming-Hao A1 Hsu, Hsiao-Hsuan A1 Ying, Lei-Ying A1 Zhang, Bao-Ping A1 Zheng, Zhi-Wei PB IOP Publishing YR 2023 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 38 IS 5 SP 055012 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/acc547 DO https://doi.org/10.1088/1361-6641/acc547 SF ELIB - SuUB Bremen
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