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1 Ergebnisse
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Nonlinear behaviors in back-gate effects of FDSOI MOSFETs a..:
Hu, Yibo
;
Ren, Zhipeng
;
Yin, Yizhe
.
Semiconductor Science and Technology. 39 (2024) 8 - p. 085007 , 2024
Link:
https://doi.org/10.1088/1361-6641/ad5e17
RT Journal T1 <Title>Nonlinear behaviors in back-gate effects of FDSOI MOSFETs at cryogenic temperatures</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_ad5e17&Exemplar=1&LAN=DE A1 Hu, Yibo A1 Ren, Zhipeng A1 Yin, Yizhe A1 Chen, Jing PB IOP Publishing YR 2024 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 39 IS 8 SP 085007 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/ad5e17 DO https://doi.org/10.1088/1361-6641/ad5e17 SF ELIB - SuUB Bremen
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