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1 Ergebnisse
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Atmospheric neutron-induced single event burnout characteri..:
Peng, Chao
;
Yang, Liu
;
Lei, Zhifeng
...
Semiconductor Science and Technology. 39 (2024) 8 - p. 085011 , 2024
Link:
https://doi.org/10.1088/1361-6641/ad634c
RT Journal T1 <Title>Atmospheric neutron-induced single event burnout characterization of 4.5 kV Si IGBTs with spallation neutron irradiation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6641_ad634c&Exemplar=1&LAN=DE A1 Peng, Chao A1 Yang, Liu A1 Lei, Zhifeng A1 Zhou, Yuebin A1 Ma, Teng A1 Yuan, Zhiyong A1 Zhang, Zhangang A1 He, Yujuan A1 Huang, Yun PB IOP Publishing YR 2024 SN 0268-1242 SN 1361-6641 JF Semiconductor Science and Technology VO 39 IS 8 SP 085011 LK http://dx.doi.org/https://doi.org/10.1088/1361-6641/ad634c DO https://doi.org/10.1088/1361-6641/ad634c SF ELIB - SuUB Bremen
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