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Surface quality characterization of thin Nb films for super..:
Ries, R
;
Seiler, E
;
Gömöry, F
...
Superconductor Science and Technology. 35 (2022) 7 - p. 075010 , 2022
Link:
https://doi.org/10.1088/1361-6668/ac7261
RT Journal T1 <Title>Surface quality characterization of thin Nb films for superconducting radiofrequency cavities</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1361-6668_ac7261&Exemplar=1&LAN=DE A1 Ries, R A1 Seiler, E A1 Gömöry, F A1 Medvids, A A1 Onufrijevs, P A1 Pira, C A1 Chyhyrynets, E A1 Malyshev, O B A1 Valizadeh, R PB IOP Publishing YR 2022 SN 0953-2048 SN 1361-6668 JF Superconductor Science and Technology VO 35 IS 7 SP 075010 LK http://dx.doi.org/https://doi.org/10.1088/1361-6668/ac7261 DO https://doi.org/10.1088/1361-6668/ac7261 SF ELIB - SuUB Bremen
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