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1 Ergebnisse
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Characterization of 4H—SiC substrates and epilayers by Four..:
Dong, Lin
;
Sun, Guo-Sheng
;
Zheng, Liu
...
Chinese Physics B. 21 (2012) 4 - p. 047802 , 2012
Link:
https://doi.org/10.1088/1674-1056/21/4/047802
RT Journal T1
Characterization of 4H—SiC substrates and epilayers by Fourier transform infrared reflectance spectroscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1674-1056_21_4_047802&Exemplar=1&LAN=DE A1 Dong, Lin A1 Sun, Guo-Sheng A1 Zheng, Liu A1 Liu, Xing-Fang A1 Zhang, Feng A1 Yan, Guo-Guo A1 Zhao, Wan-Shun A1 Wang, Lei A1 Li, Xi-Guang A1 Wang, Zhan-Guo PB IOP Publishing YR 2012 SN 1674-1056 JF Chinese Physics B VO 21 IS 4 SP 047802 LK http://dx.doi.org/https://doi.org/10.1088/1674-1056/21/4/047802 DO https://doi.org/10.1088/1674-1056/21/4/047802 SF ELIB - SuUB Bremen
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