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1 Ergebnisse
1
Negative bias-induced threshold voltage instability and zen..:
Zhu, Qing
;
Ma, Xiao-Hua
;
Chen, Yi-Lin
...
Chinese Physics B. 29 (2020) 4 - p. 047304 , 2020
Link:
https://doi.org/10.1088/1674-1056/ab7809
RT Journal T1
Negative bias-induced threshold voltage instability and zener/interface trapping mechanism in GaN-based MIS-HEMTs*
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1674-1056_ab7809&Exemplar=1&LAN=DE A1 Zhu, Qing A1 Ma, Xiao-Hua A1 Chen, Yi-Lin A1 Hou, Bin A1 Zhu, Jie-Jie A1 Zhang, Meng A1 Wu, Mei A1 Yang, Ling A1 Hao, Yue PB IOP Publishing YR 2020 SN 1674-1056 JF Chinese Physics B VO 29 IS 4 SP 047304 LK http://dx.doi.org/https://doi.org/10.1088/1674-1056/ab7809 DO https://doi.org/10.1088/1674-1056/ab7809 SF ELIB - SuUB Bremen
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