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1 Ergebnisse
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Soft error generation analysis in combinational logic circu..:
Qian, Ding
;
Yu, Wang
;
Rong, Luo
..
Journal of Semiconductors. 31 (2010) 9 - p. 095015 , 2010
Link:
https://doi.org/10.1088/1674-4926/31/9/095015
RT Journal T1
Soft error generation analysis in combinational logic circuits
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1674-4926_31_9_095015&Exemplar=1&LAN=DE A1 Qian, Ding A1 Yu, Wang A1 Rong, Luo A1 Hui, Wang A1 Huazhong, Yang PB IOP Publishing YR 2010 SN 1674-4926 JF Journal of Semiconductors VO 31 IS 9 SP 095015 LK http://dx.doi.org/https://doi.org/10.1088/1674-4926/31/9/095015 DO https://doi.org/10.1088/1674-4926/31/9/095015 SF ELIB - SuUB Bremen
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