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1 Ergebnisse
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A different approach for determining the responsivity of n+..:
Esebamen, Omeime Xerviar
;
Thungström, Göran
;
Nilsson, Hans-Erik
Journal of Semiconductors. 33 (2012) 7 - p. 074002 , 2012
Link:
https://doi.org/10.1088/1674-4926/33/7/074002
RT Journal T1
A different approach for determining the responsivity of n+p detectors using scanning electron microscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1674-4926_33_7_074002&Exemplar=1&LAN=DE A1 Esebamen, Omeime Xerviar A1 Thungström, Göran A1 Nilsson, Hans-Erik PB IOP Publishing YR 2012 SN 1674-4926 JF Journal of Semiconductors VO 33 IS 7 SP 074002 LK http://dx.doi.org/https://doi.org/10.1088/1674-4926/33/7/074002 DO https://doi.org/10.1088/1674-4926/33/7/074002 SF ELIB - SuUB Bremen
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