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Noise-induced resistive switching in a memristor based on Z..:
Filatov, D O
;
Vrzheshch, D V
;
Tabakov, O V
...
Journal of Statistical Mechanics: Theory and Experiment. 2019 (2019) 12 - p. 124026 , 2019
Link:
https://doi.org/10.1088/1742-5468/ab5704
RT Journal T1 <Title>Noise-induced resistive switching in a memristor based on ZrO2(Y)/Ta2O5 stack</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1742-5468_ab5704&Exemplar=1&LAN=DE A1 Filatov, D O A1 Vrzheshch, D V A1 Tabakov, O V A1 Novikov, A S A1 Belov, A I A1 Antonov, I N A1 Sharkov, V V A1 Koryazhkina, M N A1 Mikhaylov, A N A1 Gorshkov, O N A1 Dubkov, A A A1 Carollo, A A1 Spagnolo, B PB IOP Publishing YR 2019 SN 1742-5468 JF Journal of Statistical Mechanics: Theory and Experiment VO 2019 IS 12 SP 124026 LK http://dx.doi.org/https://doi.org/10.1088/1742-5468/ab5704 DO https://doi.org/10.1088/1742-5468/ab5704 SF ELIB - SuUB Bremen
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