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Metrological characterization of MEMS accelerometers by LDV:
D'Emilia, Giulio
;
Gaspari, Antonella
;
Mazzoleni, Fabrizio
...
Journal of Physics: Conference Series. 1589 (2020) 1 - p. 012011 , 2020
Link:
https://doi.org/10.1088/1742-6596/1589/1/012011
RT Journal T1
Metrological characterization of MEMS accelerometers by LDV
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1742-6596_1589_1_012011&Exemplar=1&LAN=DE A1 D'Emilia, Giulio A1 Gaspari, Antonella A1 Mazzoleni, Fabrizio A1 Natale, Emanuela A1 Prato, Andrea A1 Schiavi, Alessandro PB IOP Publishing YR 2020 SN 1742-6588 SN 1742-6596 JF Journal of Physics: Conference Series VO 1589 IS 1 SP 012011 LK http://dx.doi.org/https://doi.org/10.1088/1742-6596/1589/1/012011 DO https://doi.org/10.1088/1742-6596/1589/1/012011 SF ELIB - SuUB Bremen
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