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1 Ergebnisse
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Research on automatic defect identification technology of e..:
Lijing, Yin
;
Kui, Zhang
;
Yaru, Cui
..
Journal of Physics: Conference Series. 1693 (2020) 1 - p. 012210 , 2020
Link:
https://doi.org/10.1088/1742-6596/1693/1/012210
RT Journal T1 <Title>Research on automatic defect identification technology of electronic components</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1742-6596_1693_1_012210&Exemplar=1&LAN=DE A1 Lijing, Yin A1 Kui, Zhang A1 Yaru, Cui A1 Shengbiao, An A1 Jie, Huang PB IOP Publishing YR 2020 SN 1742-6588 SN 1742-6596 JF Journal of Physics: Conference Series VO 1693 IS 1 SP 012210 LK http://dx.doi.org/https://doi.org/10.1088/1742-6596/1693/1/012210 DO https://doi.org/10.1088/1742-6596/1693/1/012210 SF ELIB - SuUB Bremen
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