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1 Ergebnisse
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Evaluation of p-GaN HEMTs degradation under high temperatur..:
Jiang, Kun
;
Deng, Jing
;
Ni, Yiqiang
...
Journal of Physics: Conference Series. 2645 (2023) 1 - p. 012016 , 2023
Link:
https://doi.org/10.1088/1742-6596/2645/1/012016
RT Journal T1 <Title>Evaluation of p-GaN HEMTs degradation under high temperatures forward and reverse gate bias stress</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1742-6596_2645_1_012016&Exemplar=1&LAN=DE A1 Jiang, Kun A1 Deng, Jing A1 Ni, Yiqiang A1 Liu, Jun A1 Liu, Xin A1 He, Zhiyuan A1 He, Liang PB IOP Publishing YR 2023 SN 1742-6588 SN 1742-6596 JF Journal of Physics: Conference Series VO 2645 IS 1 SP 012016 LK http://dx.doi.org/https://doi.org/10.1088/1742-6596/2645/1/012016 DO https://doi.org/10.1088/1742-6596/2645/1/012016 SF ELIB - SuUB Bremen
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