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1 Ergebnisse
1
Image-guided Structure-constrained Inversion of Electrical ..:
Ma, Xinmin
;
Han, Jingjing
;
Chao, Chen
...
Journal of Physics: Conference Series. 2651 (2023) 1 - p. 012106 , 2023
Link:
https://doi.org/10.1088/1742-6596/2651/1/012106
RT Journal T1
Image-guided Structure-constrained Inversion of Electrical Resistivity Data for Improving Contaminations Characterization
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1742-6596_2651_1_012106&Exemplar=1&LAN=DE A1 Ma, Xinmin A1 Han, Jingjing A1 Chao, Chen A1 Li, Jing A1 Zhou, Jieyi A1 Xia, Teng A1 Mao, Deqiang PB IOP Publishing YR 2023 SN 1742-6588 SN 1742-6596 JF Journal of Physics: Conference Series VO 2651 IS 1 SP 012106 LK http://dx.doi.org/https://doi.org/10.1088/1742-6596/2651/1/012106 DO https://doi.org/10.1088/1742-6596/2651/1/012106 SF ELIB - SuUB Bremen
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