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CMOS-sensors for energy-resolved X-ray imaging:
Doering, D.
;
Amar-Youcef, S.
;
Baudot, J.
...
Journal of Instrumentation. 11 (2016) 1 - p. C01013-C01013 , 2016
Link:
https://doi.org/10.1088/1748-0221/11/01/c01013
RT Journal T1 <Title>CMOS-sensors for energy-resolved X-ray imaging</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1748-0221_11_01_c01013&Exemplar=1&LAN=DE A1 Doering, D. A1 Amar-Youcef, S. A1 Baudot, J. A1 Deveaux, M. A1 Dulinski, W. A1 Kachel, M. A1 Linnik, B. A1 Müntz, C. A1 Stroth, Joachim PB IOP Publishing YR 2016 SN 1748-0221 JF Journal of Instrumentation VO 11 IS 1 SP C01013 OP C01013 LK http://dx.doi.org/https://doi.org/10.1088/1748-0221/11/01/c01013 DO https://doi.org/10.1088/1748-0221/11/01/c01013 SF ELIB - SuUB Bremen
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