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On the determination of the substrate effective doping conc..:
García, M. Fernández
;
Sánchez, J. González
;
Echeverría, R. Jaramillo
...
Journal of Instrumentation. 12 (2017) 1 - p. C01038-C01038 , 2017
Link:
https://doi.org/10.1088/1748-0221/12/01/c01038
RT Journal T1
On the determination of the substrate effective doping concentration of irradiated HV-CMOS sensors using an edge-TCT technique based on the Two-Photon-Absorption process
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1748-0221_12_01_c01038&Exemplar=1&LAN=DE A1 García, M. Fernández A1 Sánchez, J. González A1 Echeverría, R. Jaramillo A1 Moll, M. A1 Montero, R. A1 Moya, D. A1 Pinto, R. Palomo A1 Vila, I. PB IOP Publishing YR 2017 SN 1748-0221 JF Journal of Instrumentation VO 12 IS 1 SP C01038 OP C01038 LK http://dx.doi.org/https://doi.org/10.1088/1748-0221/12/01/c01038 DO https://doi.org/10.1088/1748-0221/12/01/c01038 SF ELIB - SuUB Bremen
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