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1 Ergebnisse
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Electron mobility-lifetime and resistivity mapping of GaAs:..:
Chsherbakov, I.
;
Kolesnikova, I.
;
Lozinskaya, A.
...
Journal of Instrumentation. 12 (2017) 2 - p. C02016-C02016 , 2017
Link:
https://doi.org/10.1088/1748-0221/12/02/c02016
RT Journal T1
Electron mobility-lifetime and resistivity mapping of GaAs:Cr wafers
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1748-0221_12_02_c02016&Exemplar=1&LAN=DE A1 Chsherbakov, I. A1 Kolesnikova, I. A1 Lozinskaya, A. A1 Mihaylov, T. A1 Novikov, V. A1 Shemeryankina, A. A1 Tolbanov, O. A1 Tyazhev, A. A1 Zarubin, A. PB IOP Publishing YR 2017 SN 1748-0221 JF Journal of Instrumentation VO 12 IS 2 SP C02016 OP C02016 LK http://dx.doi.org/https://doi.org/10.1088/1748-0221/12/02/c02016 DO https://doi.org/10.1088/1748-0221/12/02/c02016 SF ELIB - SuUB Bremen
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