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Layout options of spectroscopic X-ray DEPFETs:
Treberspurg, W.
;
Andritschke, R.
;
Bähr, A.
...
Journal of Instrumentation. 14 (2019) 8 - p. P08008-P08008 , 2019
Link:
https://doi.org/10.1088/1748-0221/14/08/p08008
RT Journal T1 <Title>Layout options of spectroscopic X-ray DEPFETs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1748-0221_14_08_p08008&Exemplar=1&LAN=DE A1 Treberspurg, W. A1 Andritschke, R. A1 Bähr, A. A1 Behrens, A. A1 Hauser, G. A1 Lechner, P. A1 Meidinger, N. A1 Müller-Seidlitz, J. A1 Richter, R.H. A1 Treis, J. PB IOP Publishing YR 2019 SN 1748-0221 JF Journal of Instrumentation VO 14 IS 8 SP P08008 OP P08008 LK http://dx.doi.org/https://doi.org/10.1088/1748-0221/14/08/p08008 DO https://doi.org/10.1088/1748-0221/14/08/p08008 SF ELIB - SuUB Bremen
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