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1 Ergebnisse
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Applying fully convolutional networks for beam profile and ..:
Zhu, Wenchao
;
Wei, Zhengyu
;
Liang, Yu
...
Journal of Instrumentation. 18 (2023) 10 - p. P10039 , 2023
Link:
https://doi.org/10.1088/1748-0221/18/10/p10039
RT Journal T1
Applying fully convolutional networks for beam profile and emittance measurements
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1748-0221_18_10_p10039&Exemplar=1&LAN=DE A1 Zhu, Wenchao A1 Wei, Zhengyu A1 Liang, Yu A1 Xie, Chunjie A1 Lu, Ping A1 Lu, Yalin A1 Wang, Lin A1 Li, Haohu A1 Zhou, Zeran PB IOP Publishing YR 2023 SN 1748-0221 JF Journal of Instrumentation VO 18 IS 10 SP P10039 LK http://dx.doi.org/https://doi.org/10.1088/1748-0221/18/10/p10039 DO https://doi.org/10.1088/1748-0221/18/10/p10039 SF ELIB - SuUB Bremen
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