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1 Ergebnisse
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Testbeam results of irradiated SiGe BiCMOS monolithic silic..:
Moretti, T.
;
Milanesio, M.
;
Cardella, R.
...
Journal of Instrumentation. 19 (2024) 7 - p. P07036 , 2024
Link:
https://doi.org/10.1088/1748-0221/19/07/p07036
RT Journal T1
Testbeam results of irradiated SiGe BiCMOS monolithic silicon pixel detector without internal gain layer
UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1748-0221_19_07_p07036&Exemplar=1&LAN=DE A1 Moretti, T. A1 Milanesio, M. A1 Cardella, R. A1 Kugathasan, T. A1 Picardi, A. A1 Semendyaev, I. A1 Elviretti, M. A1 Rücker, H. A1 Nakamura, K. A1 Takubo, Y. A1 Togawa, M. A1 Cadoux, F. A1 Cardarelli, R. A1 Cecconi, L. A1 Débieux, S. A1 Favre, Y. A1 Fenoglio, C.A. A1 Ferrere, D. A1 Gonzalez-Sevilla, S. A1 Iodice, L. A1 Kotitsa, R. A1 Magliocca, C. A1 Nessi, M. A1 Pizarro-Medina, A. A1 Sabater Iglesias, J. A1 Saidi, J. A1 Vicente Barreto Pinto, M. A1 Zambito, S. A1 Paolozzi, L. A1 Iacobucci, G. PB IOP Publishing YR 2024 SN 1748-0221 JF Journal of Instrumentation VO 19 IS 7 SP P07036 LK http://dx.doi.org/https://doi.org/10.1088/1748-0221/19/07/p07036 DO https://doi.org/10.1088/1748-0221/19/07/p07036 SF ELIB - SuUB Bremen
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