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1 Ergebnisse
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The Influence to Uniform Current Distribution of SiC MOSFET..:
Lu, Wenhao
;
Wan, Caiping
;
Zhang, Xizi
...
IOP Conference Series: Earth and Environmental Science. 772 (2021) 1 - p. 012032 , 2021
Link:
https://doi.org/10.1088/1755-1315/772/1/012032
RT Journal T1 <Title>The Influence to Uniform Current Distribution of SiC MOSFET Modules Based on the 3rd Quadrant Characteristics</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1755-1315_772_1_012032&Exemplar=1&LAN=DE A1 Lu, Wenhao A1 Wan, Caiping A1 Zhang, Xizi A1 Du, Yujie A1 Ge, Niannian A1 Xu, Hengyu A1 Ye, Tianchun PB IOP Publishing YR 2021 SN 1755-1307 SN 1755-1315 JF IOP Conference Series: Earth and Environmental Science VO 772 IS 1 SP 012032 LK http://dx.doi.org/https://doi.org/10.1088/1755-1315/772/1/012032 DO https://doi.org/10.1088/1755-1315/772/1/012032 SF ELIB - SuUB Bremen
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