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Detection and defect correction of operating process:
Vasendina, Elena
;
Plotnikova, Inna
;
Levitskaya, Anastasiya
.
IOP Conference Series: Materials Science and Engineering. 110 (2016) - p. 012070 , 2016
Link:
https://doi.org/10.1088/1757-899x/110/1/012070
RT Journal T1 <Title>Detection and defect correction of operating process</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1757-899x_110_1_012070&Exemplar=1&LAN=DE A1 Vasendina, Elena A1 Plotnikova, Inna A1 Levitskaya, Anastasiya A1 Kvesko, Svetlana PB IOP Publishing YR 2016 SN 1757-8981 SN 1757-899X JF IOP Conference Series: Materials Science and Engineering VO 110 SP 012070 LK http://dx.doi.org/https://doi.org/10.1088/1757-899x/110/1/012070 DO https://doi.org/10.1088/1757-899x/110/1/012070 SF ELIB - SuUB Bremen
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