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1 Ergebnisse
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Modelling of thermal field and point defect dynamics during..:
Sabanskis, A
;
Virbulis, J
IOP Conference Series: Materials Science and Engineering. 355 (2018) - p. 012003 , 2018
Link:
https://doi.org/10.1088/1757-899x/355/1/012003
RT Journal T1 <Title>Modelling of thermal field and point defect dynamics during silicon single crystal growth using CZ technique</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1757-899x_355_1_012003&Exemplar=1&LAN=DE A1 Sabanskis, A A1 Virbulis, J PB IOP Publishing YR 2018 SN 1757-8981 SN 1757-899X JF IOP Conference Series: Materials Science and Engineering VO 355 SP 012003 LK http://dx.doi.org/https://doi.org/10.1088/1757-899x/355/1/012003 DO https://doi.org/10.1088/1757-899x/355/1/012003 SF ELIB - SuUB Bremen
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