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AFM investigation of MoS2 thin films:
Belikov, A I
;
Nhan, Do Thi
;
Kalinin, V N
IOP Conference Series: Materials Science and Engineering. 387 (2018) - p. 012007 , 2018
Link:
https://doi.org/10.1088/1757-899x/387/1/012007
RT Journal T1 <Title>AFM investigation of MoS2 thin films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1088_1757-899x_387_1_012007&Exemplar=1&LAN=DE A1 Belikov, A I A1 Nhan, Do Thi A1 Kalinin, V N PB IOP Publishing YR 2018 SN 1757-8981 SN 1757-899X JF IOP Conference Series: Materials Science and Engineering VO 387 SP 012007 LK http://dx.doi.org/https://doi.org/10.1088/1757-899x/387/1/012007 DO https://doi.org/10.1088/1757-899x/387/1/012007 SF ELIB - SuUB Bremen
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